|X-Ray tube:||Ceramic Cu X-ray tube, power capability of 2 kW, water cooling, "long fine focus", elimination of Kβ (Ni filter)|
|Goniometer:||Vertical goniometer of Θ-Θ geometry, independent Θ and 2Θ driving gears, angle range from 0.2o, possibility to change the diameter of the goniometer, angular precision 0.001o|
|Optics:||Optical modules at the primary and secondary beam: slits and colimators for diffractometry and reflectivity measurements with three computer operated elements; possibility to measure with Goebel mirror; the PreFix system allows easy exchange (no re-alignment) of details|
|Detectors:||Proportional detector for reflectivity measurements; real time multiple strip detector for xrd measurements allows to obtain ultrafast data collection|
|Others:||The high-temperature chamber designed for measurements at temperatures up to 1200oC;
Open Eulerian Cradle for investigations of stress and texture;
Capillary spinner for transmission measurements;
Thin film and multilayer reflectometry and grazing incidence diffraction; investigations of stress and texture; mapping of reciprocal space
Fig. 1. X-Ray diffraction pattern for 10 nm thick nanocrystalline FePd alloy with 8% of copper admixture on SiO2/Si substrate.
Fig. 3. Two-dimensional (111) pole figure for 10 nm thick FePt alloy film on MgO(100) substrate.
Fig. 2. X-Ray reflectivity pattern for MgO/Cr(20nm)/[Fe(2nm)/Cr(1,2nm)]x6/Cr(5nm) multilayer.