IFJ PAN, home-made atomic force microscopy
- Maximum scan range in X-Y plane: 100 μm x 100 μm;
- Maximum Z range: 50 μm;
- Working modes: contact AFM, LFM, force spectroscopy;
The microscope is equipped with liquid cell setup working at room temperature. Top view optics (Nikon) is used to observe sample surface.
Home-made AFM working at the IFJ PAN in Cracow (side and top vies).