O.Filies, O.Böling, K.Grewer, J.Lekki, M.Lekka, Z.Stachura, B.Cleff – Surface Roughness of Thin Layers – A Comparison of XRD and SFM Measurements, App. Surf. Sci. 141 (1999) 357-365. IF = 2.469;
J.Rysz, H.Ermer, A.Budkowski, M.Lekka, A.Bernasik, S.Wróbel, R.Brenn, J.Lekki and J. Jedlinski – Depth profiling of the surface directed phase decomposition in thin polymer, Vacuum 54 (1999) 303-307. IF = 1.412;
M.Lekka, P.Laidler, D.Gil, J.Lekki, Z.Stachura, A.Z.Hrynkiewicz – Elasticity of normal and cancerous human bladder cells studied by scanning force microscopy, Eur. Biophys. J. 28 1999, 312-316. IF = 2.237;
M.Lekka, J.Lekki, M.Marszalek, P.Golonka, Z.Stachura, B.Cleff, A.Z.Hrynkiewicz – Local elastic properties of cells studied by SFM, App. Surf. Sci. 141 (1999) 345-349. IF = 2.469;
1998
M.Lekka, J.Lekki, M.Marszałek, Z.Stachura, and B.Cleff – Local Adhesive Surface Properties Studied by Force Microscopy, Acta Phys. Pol. A 93 (1998) 421-424. IF = 0.511;
1997
B.Kubica, W.M.Kwiatek, E.M.Dutkiewicz, and M.Lekka – Sample preparation procedure for PIXE analysis on soft tissues, J. Radioanal. Nucl. Chem. 223 (1997) 247-249. IF = 1.242;
1996
J.Lekki, M.Lekka, H.Romano, B.Cleff, Z.Stachura – Scanning Force Microscopy Studies of Implanted Silicon Crystals, Acta Phys. Pol. A 89 (1996) 315-322. IF = 0.511;
W.M.Kwiatek, T.Drewniak, M.Lekka, A.Wajdowicz – Investigations of trace elements in cancer kidney tissues by SRIXE and PIXE, Nucl. Instrum. Meth. B 109/110 (1996) 284-288. IF = 1.324;
M.Lekka, J.Lekki, A.P.Shoulyarenko, B.Cleff, J.Stachura, and Z.Stachura – Scanning Force Microscopy of Biological Samples, Pol. J. Pathol., 47 (1996) 51-55. IF = 0.750;
